Get Exam Updates
⚡Only for first 10 students 🎉 15 CAT Mocks & 45 Sectionals for just Rs. 999 👉 Grab now
The purpose of Design for Test (DFT) process in ASIC design flow is
To capture functional errors
To capture manufacturing defects
To capture timing violations
For radiation mitigation
Create a FREE account and get:
Ask doubts feature is currently unavailable for you. You can reach us at email@example.com for any further details/doubts.
Boost your Prep!